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The Metric programs were developed in the Applied Analysis & Mathematical Physics Group and the Integrated Optical MicroSystems Group, MESA+ Institute for Nanotechnology, University of Twente, Enschede, The Netherlands. Comments and bug reports are welcome, please contactManfred Hammer
University of Twente
Faculty of Electrical Engineering,
Mathematics, and Computer Science,
P.O. Box 217
7500 AE Enschede
The NetherlandsPhone: +31/53/489-3448
Fax: +31/53/489-3996
m.hammer@ewi.utwente.nl
www.ewi.utwente.nl/~hammerm/